MILPITAS, Calif. — (BUSINESS WIRE) — May 15, 2012 — Nanometrics Incorporated (NASDAQ: NANO), a leading provider of advanced process control metrology and inspection systems, today announced that Dr. Timothy J. Stultz, president and chief executive officer, is scheduled to participate in the following investor events:
D.A. Davidson 4th Annual Technology Forum
Grand Hyatt New York
New York, NY
Event date: May 30, 2012
Cowen & Company 40th Annual Technology,
Media & Telecom Conference
The New York Palace Hotel
New York, NY
Event dates: May 30 and 31, 2012
Presentation time: 11:45 AM EDT on May 31
The presentation slides utilized for both events as well as a live and archived webcast of the Cowen & Company presentation will be made accessible on the investor page of Nanometrics’ website at www.nanometrics.com.
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics’ automated and integrated systems address numerous process control applications, including critical dimension and film thickness measurement, device topography, defect inspection, overlay registration, and analysis of various other film properties such as optical, electrical and material characteristics. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics’ website is http://www.nanometrics.com.